Applied Physics · Precision technologies since 1992
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Precision Calibration for Scanning Probe Microscopy (SPM)

Atomic Force Microscope probe scanning a nanoscale silicon surface, atomic lattice structure visible beneath

Scanning Probe Microscopy (SPM) has revolutionized our ability to visualize and manipulate matter at the atomic and molecular scales. However, the data produced by an SPM is only as reliable as the system’s calibration. Precision calibration is the bridge between a beautiful topographic image and scientifically accurate metrology. Without rigorous calibration, measurements of height, lateral […]

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