Material
Choose PSL, silica or another material required by the method.
The fastest path to the right quote is to specify what the instrument is measuring and the physical form the workflow actually requires.
Choose PSL, silica or another material required by the method.
Provide target diameter or size set and the tolerance/certificate requirement.
Specify suspension, dry powder, deposited wafer or another prepared reference.
Use the product quote control. Your selected product, variation and quantity will remain attached to the request while you add application and technical details.
Provide the instrument or application, particle material, nominal size or size set, delivery form, certificate or traceability requirement, quantity and target delivery date.
No. Select the particle material required by the instrument, SOP or study objective rather than substituting only by nominal diameter.
For a deposited wafer, specify wafer diameter/substrate, particle material and size, deposition geometry and inspection-tool/recipe objective.
| Material / family | Start here when the requirement is… | Quote variables |
|---|---|---|
| PSL / polystyrene latex | Monodisperse particle-size references, particle-counter/optical calibration, aerosol work, or deposited wafer references. | Instrument/application, nominal size(s), form/concentration, quantity, certificate/traceability. |
| Silica / SiO₂ | Silica reference behavior, contamination-wafer work, optical/material research, or functionalized silica formulations. | Size, surface treatment/functionalization, powder vs suspension, solvent/concentration, quantity. |
| Borosilicate / glass | Powder/particle-size measurement and methods where glass material properties and available size ranges are appropriate. | Method/instrument, nominal size/range, quantity, sample preparation and documentation. |
| Fluorescent / dyed polymer | Imaging, tracking, optical method development, method visibility or research requiring a colored/fluorescent signal. | Size, color/excitation-emission, surface chemistry, dry/suspension form, concentration/quantity. |
| Functionalized / assay particles | Conjugation, binding, lateral-flow, diagnostic or assay-development workflows. | Core material, size, functional group/coating, concentration, conjugation target and assay conditions. |
| Magnetic / metallic nanoparticles | Research workflows where magnetic response, plasmonic/optical properties or specialized surface chemistry are part of the method. | Composition, size, morphology, coating/functionalization, concentration and application. |
Start with PSL or another method-specified reference size. Capture the instrument/model, channel or target diameter, procedure and documentation requirement.
Particle Counter StandardsUse particle suspensions or deposited wafers according to the inspection tool, substrate, recipe and calibration objective.
Wafer StandardsSeparate the particle reference from the aerosol-generation/dilution method. Specify the test method, target size and equipment context.
PSL Aerosol GeneratorsChoose size plus fluorescent properties, surface chemistry and form around the imaging or tracking method.
Fluorescent MicrospheresChoose functional group, particle size, material and concentration around conjugation chemistry and assay architecture.
Functionalized ParticlesChoose core composition, size, coating/functionalization, concentration/form and method-specific documentation.
Silica & GlassApplied Physics has overlapping particle families and many individual size SKUs. The correct quote should be driven by the customer's method and required reference properties—not by whichever product title happens to rank first.
For an accurate quote: use the product quote control so the selected product, variation and quantity remain attached to your request.
The same nominal diameter can serve very different purposes. Start with the instrument and the physical reference it can actually use.
Low-density, optically useful reference spheres available across nanometer and micron-scale families.
Explore PSL →Higher-density materials with different optical, surface and handling behavior.
Explore silica & glass →Particles selected by optical response as well as diameter for imaging, flow and tracer work.
Explore optical particles →Surface-modified particles for coupling, assay, diagnostic and research-development workflows.
Explore surface chemistry →Ready for compatible liquid, microscopy, aerosol-generation or deposition workflows.
Requires a defined dispersion, handling and agglomeration-control method.
Adds substrate, surface and deposition geometry for SSIS or wafer-inspection work.
Adds a defined concentration for liquid particle-counter counting or volumetric checks.
ISO 21501-4 addresses calibration and verification of light-scattering airborne particle counters, including size setting, counting efficiency and related performance characteristics. It does not make every microsphere a universal standard.
Confirm the exact instrument, medium, nominal channel, concentration, certificate and acceptance procedure before ordering.
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