Description
Our Uniform Polymer Microspheres are expertly manufactured from polystyrene cross linked with divinylbenzene to provide exceptional durability, chemical stability, and precision. Supplied in a convenient dry 1 gram format, these particles cover a precise size range from 3 microns to 10 microns. The mean diameters of these polymer beads have been strictly calibrated using NIST traceable microscopy methods, ensuring you receive a highly reliable size standard for your most demanding analytical methods.
These microparticles effectively eliminate the inconsistencies often caused by irregularly shaped particles in analytical systems. Their uniform spherical shape makes them highly suitable for instrument validation, particle counter calibration, and analyzing a wide size range of materials through laser diffraction or other light scattering techniques. Applied Physics USA maintains rigorous engineering, production, and metrology standards so these reference materials consistently meet your exacting research, quality control, and diagnostic needs.
Features:
Material is composed of polystyrene cross linked with divinylbenzene for superior durability and chemical stability
Particle spheres are used instead of irregularly shaped particles for enhanced measurement accuracy
Mean diameters are strictly calibrated using NIST traceable optical microscopy methods
Packaged as dry spheres for optimal handling and long term structural stability
Supplied in a convenient 1 gram quantity to accommodate specific application volumes
Available in precise sizes ranging from 3μm to 10μm
Benefits:
Minimizes the response of analytical systems to unwanted shape effects
Delivers consistent and repeatable measurements across various detector types
Provides an exceptionally reliable and precise NIST traceable size standard
Avoids the limitations and diagnostic errors associated with non spherical reference materials
Dry format ensures excellent long term stability and easy integration into custom laboratory workflows
Recommended For:
Validating and calibrating particle counters and laser diffraction instruments
Narrow size standard deviation applications
Quality control and metrology workflows where shape effects must be eliminated
Analyzing wide size range materials in industrial and academic particle research facilities
Product relationship
Available Through Applied Physics
Applied Physics supplies and supports quotation of this product. Product branding and manufacturer information, where stated on the product page or supporting documentation, remain authoritative.
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Catalog relationship: Available Through Applied Physics
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