Atomic Force Microscopy

Description

Atomic Force Microscopy

Features:
1. Integrated scanning-probe and sample-stage enhances the anti-interference ability of the spring suspension system.

2. Precision laser and probe positioning device makes probe changing and spot adjusting simple and convenient.

3. The sample-to-probe auto-approaching provides an efficient way to prevent cantilever crash.

4. The vertical sample probe approaching allows achieving precise positioning of area of interest.

5. Sample scanning area of interest may be freely selected with an high-precision/wide-range XY table.

6. Top-view CCD system warrants real-time observation and positioning of the probe on the selected sample region.

7. Modular design of electronic control system facilitates maintenance and continuous improvements.

8. The compact model 2000 may be easily transported inside an aluminum luggage.

9. The hermetic box in model 1000 provides a controlled environment.

Technical Parameters:

Model

BK-AFM1000

Working Modes

Contact mode and lapping mode

Optional modes: Phase, Friction(LFM), Magnetic(MFM), Electrostatic(EFM)

Sample Size

Ф≤90mm, H≤20mm

Scanners Available

10*10μm, 20*20μm, 50*50μm, 100*100μm

Scanning Resolution

0.2nm in XY direction, 0.05nm in Z direction

Range of Sample Movement

±6.5mm

Step-motor Pulse Width

10±2ms

Image Sampling Points

512*512

Optical Magnification 4X

Optical resolution 2.5μm

Scan Rate 0.6Hz~4.34Hz

Scan angle 0°~360°

Scanning Control

18-bit D/A in XY direction, 16-bit D/A in Z direction

Data Sampling

14-bit A/D, double 16-bit A/D multi-channel synchronous sampling

Feedback

DSP digital feedback

Feedback Sampling Rate

64kHz

Computer interface

USB 2.0

Operating System

Windows XP/7/8/10

Supply Power

AC220V, 50/60Hz; 110V, 50/60Hz(optional)

Package Size

550*550*1150mm

Gross Weight

65kg