Atomic Force Microscopy

Atomic Force Microscopy Features: 1. Integrated scanning-probe and sample-stage enhances the anti-interference ability of the spring suspension system. 2. Precision laser and probe positioning device makes probe changing and spot adjusting simple and convenient. 3. The sample-to-probe auto-approaching provides an efficient way to prevent cantilever crash. 4. The vertical sample probe approaching allows achieving precise positioning of area of interest. 5. Sample scanning area of interest may be freely selected with an high-precision/wide-range XY table. 6. Top-view CCD system warrants real-time observation and positioning of the probe on the selected sample region. 7. Modular design of electronic control system facilitates maintenance and continuous improvements. 8. The compact model 2000 may be easily transported inside an aluminum luggage. 9. The hermetic box in model 1000 provides a controlled environment.   Technical Parameters: Model BK-AFM1000 Working Modes Contact mode and lapping mode Optional modes: Phase, Friction(LFM), Magnetic(MFM), Electrostatic(EFM) Sample Size Ф≤90mm, H≤20mm Scanners Available 10*10μm, 20*20μm, 50*50μm, 100*100μm Scanning Resolution 0.2nm in XY direction, 0.05nm in Z direction Range of Sample Movement ±6.5mm Step-motor Pulse Width 10±2ms Image Sampling Points 512*512 Optical Magnification 4X Optical resolution 2.5μm Scan Rate 0.6Hz~4.34Hz Scan angle 0°~360° Scanning Control 18-bit D/A in XY direction, 16-bit D/A in Z direction Data Sampling 14-bit A/D, double 16-bit A/D multi-channel synchronous sampling Feedback DSP digital feedback Feedback Sampling Rate 64kHz Computer interface USB 2.0 Operating System Windows XP/7/8/10 Supply Power AC220V, 50/60Hz; 110V, 50/60Hz(optional) Package Size 550*550*1150mm Gross Weight 65kg