Description
Atomic Force Microscopy
Features:
1. Integrated scanning-probe and sample-stage enhances the anti-interference ability of the spring suspension system.
2. Precision laser and probe positioning device makes probe changing and spot adjusting simple and convenient.
3. The sample-to-probe auto-approaching provides an efficient way to prevent cantilever crash.
4. The vertical sample probe approaching allows achieving precise positioning of area of interest.
5. Sample scanning area of interest may be freely selected with an high-precision/wide-range XY table.
6. Top-view CCD system warrants real-time observation and positioning of the probe on the selected sample region.
7. Modular design of electronic control system facilitates maintenance and continuous improvements.
8. The compact model 2000 may be easily transported inside an aluminum luggage.
9. The hermetic box in model 1000 provides a controlled environment.
Technical Parameters:
Model
BK-AFM1000
Working Modes
Contact mode and lapping mode
Optional modes: Phase, Friction(LFM), Magnetic(MFM), Electrostatic(EFM)
Sample Size
Ф≤90mm, H≤20mm
Scanners Available
10*10μm, 20*20μm, 50*50μm, 100*100μm
Scanning Resolution
0.2nm in XY direction, 0.05nm in Z direction
Range of Sample Movement
±6.5mm
Step-motor Pulse Width
10±2ms
Image Sampling Points
512*512
Optical Magnification 4X
Optical resolution 2.5μm
Scan Rate 0.6Hz~4.34Hz
Scan angle 0°~360°
Scanning Control
18-bit D/A in XY direction, 16-bit D/A in Z direction
Data Sampling
14-bit A/D, double 16-bit A/D multi-channel synchronous sampling
Feedback
DSP digital feedback
Feedback Sampling Rate
64kHz
Computer interface
USB 2.0
Operating System
Windows XP/7/8/10
Supply Power
AC220V, 50/60Hz; 110V, 50/60Hz(optional)
Package Size
550*550*1150mm
Gross Weight
65kg
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