Silica Particle Wafer Standards, Silica Particle Size Standards
by John Turner | Feb 10, 2020 | Silica Particles
Silica Particle Size Standards In today’s semiconductor metrology labs, the wafer inspection tools, use high powered lasers to scan 200 mm and 300 mm silicon wafers to detect surface particles down to < 30 nanometers. When calibrating high laser power scanning...- Home
- Air Technologies
- Airflow Testing Instruments
- Dust Monitors
- Portable Foggers
- Cleanroom Foggers
- Decontamination Foggers
- DF2S Decontamination Fogger
- CRF6-S Decontaminating Fogger
- Actril® Fog System (AFS)
- PBF-24- Portable Backpack Fogger
- PBF-48- Portable Backpack Fogger
- Mini-DryFog® Machine
- HVAC Sanitize and Decontamination Fogger, HVAC-5um
- WMF- Wall and Table Mounted Sanitize and Decontaminate Fogger
- WMF2- Wall and Table Mounted Sanitize and Decontaminate Fogger
- Fogger Accessories
- Indoor Air Quality Monitors
- Microbial Air Samplers
- Particle Counters
- Portable Clean Environment
- Wafer Standards
- Microspheres
- Polystyrene Microspheres
- 2000 Series Uniform Polymer Particles, 5 μm-40 μm
- 3000 Series Nanosphere, 20 nm-900 nm
- 4000 Series Monosized Beads, 1–160 μm
- 4000 Series Dry Monosized Beads
- Polystyrene, 100 nm-100 μm
- Polystyrene 3k-4k
- Polystyrene- NIST SRM, 60.4 nm-895 nm
- Polystyrene-Surf-Cal, 47 nm-3.04 μm
- Polystyrene Dry Powder Standards 3 μm-10 μm
- Silica and Glass
- Filter Test
- 7000 Series Copolymer Microsphere Suspensions
- Ezy-Cal™ Count Precision Size Standards
- Dri-Cal Particle Size Standards Beads
- Count-Cal Count Precision Size Standards
- PSL Size Standards- OptiBind, 0.1 μm-2.5 μm
- Polystyrene Puffs
- Polystyrene Microspheres
- Graphene
- Water Technologies
- AI & ML Technologies