Applied Physics, Inc. (ÅP™) can be reached at 303-678-9102. We have been in business since 1992 and provide MOUDI Cascade Impactors and Particle Samplers to Science Universities and Government laboratories. We provide the Model 2300XP1 PSL Deposition Systems to Semiconductor Device companies to calibrate the size response curves of KLA-Tencor SP1 and SP2 Wafer Inspection Systems; Topcon 3000, 5000, 7000 systems; Hitachi and ADE Scanning Surface Inspection Systems.
We also supply CVD Liquid Vaporizers to improve semiconductor, TEOS and BPSG film applications. UltraPure Cleanroom Foggers and DI Water Foggers are offered to Semiconductor and Pharmaceutical cleanroom managers to visualize airflow and turbulence around process tools and in cleanrooms. The Next Generation Impactor and Sample Recovery Systems can classify particles for metered-dose and dry powder inhaler applications in the Pharmaceutical industry. HEPA and ULPA filter test systems are supplied to locate filter leaks and certify filter efficiency. Distributors are located in Munich, Paris, London, Tokyo, Seoul, Taipei, Singapore and China. All Products are listed at left. Product highlights are shown below. |
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Cascade Impactors with sharp cut points for high resolution particle sampling from 10nm to 18um.
We offer all MOUDI Cascade Impactor Models, the
Nano-MOUDI Cascade Impactor and
Non-Rotating Moudi Cascade Impactor
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 UltraPure Cleanroom Foggers and DI Water Foggers to visualize airflow and turbulence in Class 1 to class 100,000 cleanrooms.
We offer the a variety of clean room foggers including Model 2001 UltraPure Cleanroom Fogger and
Model 2010, UltraPure Cleanroom Fogger. Here is an overview of Cleanroom Fogger Technology.
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Aerosol particle counters provide counting and sizing from 10nm to 10um. Supports smoke stack, SMOG, diesel and atmospheric contamination measurements.
We also offer condensation particle counters.
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Calibration Wafers
PSL quick check wafers and PSL Wafer Standards, calibration wafers. Duke PSL spheres, 40nm - 4um, pre-mixed or 1% concentration.
Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Cu, Ta particles in DiH2O solution.
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We offer particle deposition systems. Produce NIST traceable, PSL Wafer Standards, 20nm to 4um on 200mm &
300mm wafers; calibrate KLA-Tencor, Topcon, ADE Hitachi wafer inspection systems.
Deposit Si, SiO2, Al2O3, TiO2, Si3N4, Ti, W, Cu, Ta Particle Wafers to verify WET Bench cleaning performance, make yield improvements.
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 The Model 170 Next Generation Pharmaceutical Impactor (NGI) is a high-performance, precision, particle-classifying cascade impactor for testing metered-dose, dry-powder, and similar inhaler devices.
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